The next Rouen Atom Probe School will take place from 16 to 20 October 2017 in our lab.
This school will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.
Deadline September 15th, 2017
The participation to the school is free of charge
The number of participants is limited to 20 people
Williams Lefebvre and François Vurpillot
Please note that the European APT work shop registration is open.
The next Atom Probe Tomography and Microscopy Symposium (APT&M 2018) run by The International Field Emission Society (IFES) will be held from June 10 to June 15, 2018 in the United States at the National Institute of Standards and Technology (NIST), in Gaithersburg, Maryland. A fitting location, since it was at NIST, just over 50 years ago, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope (14th Field Emission Symposium, 1967).
• Three major airports service the area and there are 24+ hotels within a short driving distance of NIST.
• Public transportation is also available through the Metro subway, MARC rail service, MTA bus service, and taxis.
The symposium venue is in close proximity to the nation’s capital, Washington D.C., and several other cities of interest in Maryland and Virginia, including: Baltimore, Annapolis, and Frederick. Washington D.C. is a major tourist, research, and academic hub and is home to many institutions.
Please come join your colleagues for this exciting IFES symposium in 2018.
Additional details about the meeting will be posted as the meeting draws nearer.
High electric fields in electrochemistry and in atom probe tomography
The workshop aims at a discussion of the requirements, challenges and possibilities for an effective description of moderate to intense electric field and its effect on liquid, matter and isolated atoms and particles. We expect stimulating discussions on recent results and scientific concepts.
We would like to invite you to participate in our three-days workshop, which will be held between March 29 and April 1, 2017 at Ringberg Castle. The purpose of the workshop is to bring together distinguished scientists working in the area of atom probe tomography, field-ion microscopy and electrochemistry, to discuss possibilities, requirements, and challenges for the effective modeling of electric fields across a wide range.
The exchange of ideas between seemingly different fields often drives progress, particularly in areas where scientists face similar methodological problems, and advances in the development of effective modeling techniques will be beneficial to each field. To provide ample time for discussion and exchange the workshop will be restricted to 35 participants. Each invited speaker is asked to give a 60-minute tutorial like presentation (not including the discussion of appr. 20 min).
More details here:
The International Field Emission Society (IFES) is pleased to introduce awards for outstanding papers contributed to the Microscopy & Microanalysis (M&M) meeting, officially sponsored by the Society, competitively judged based upon the quality of the submitted paper.
These awards are provided to students or postdoctoral researchers in the first two years of their career to help defray travel, lodging and other costs of attending the meeting. All awardees must fit the award criteria, as described here, at the time of the M&M meeting.
The International Field Emission Society will co-sponsor Microscopy & Microanalysis 2017 August 6-10, 2017 in St. Louis, MO.
The symposium organised by IFES at this conference will mark the 50th anniversary since the development of atom probe. There will be three APT-related symposia at this conference and the entire conference is co-sponsored by IFES so we strongly encourage your attendance.
Here the topic of the differents sessions :
A11 Instrumentation of Atom Probe: 50 Years and Counting
Ross Marceau, Prakash Kolli, Thomas Kelly
*Featured Invited Speaker: John Panitz, Emeritus Professor of Physics, University of New Mexico
The year 2017 marks the 50th anniversary of atom probe. The technique has a rich history from its origin with field ion microscopy as a precursor, through the evolution of many advancements, to the recent flourishing of its most prominent form, atom probe tomography (APT). The proliferation of APT has continued with its impact upon an increasingly broad range of materials research. The aim of this symposium is twofold: to capture and showcase some of the key historical breakthroughs that underpin the technique to this day, noting their associated impacts on scientific research; and to highlight ongoing research at the cutting edge of APT instrumentation and technique development. Contributions are welcome from both these areas. Please also see below for suggested topics of interest.
A12 Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography
Baptiste Gault, Arun Deveraj, David J. Larson
This symposium is part of the event organized for the 50th anniversary of the atom probe, and will focus on the methods used to treat raw data, in order to build the point-cloud that constitutes the tomographic reconstruction, as well as the methods applied to the point cloud to extract information regarding the presence of secondary phases, atomic clusters, or local structure (e.g. atomic planes). Another aspect that will be covered are numerical simulations of the field evaporation process which underpins atom probe tomography, and which enable to gain a better understanding of the fundamental aspects of the technique, including the image formation and some of the artifacts commonly affecting the data. Target attendees will include scientists and engineers from all levels with an interest in atom probe tomography.
A13 Applications of Atom Probe Tomography
Michael Moody, Mattias Thuvander, Didier Blavette
Atom probe tomography (APT) continues to be adapted for the atomic-scale characterisation of an increasingly diverse range of materials and devices. APT underpins research into a wide variety of alloys and semiconductors, and more recently, the analysis of materials previously considered too exotic for APT, such as minerals, bio-materials and large band gap insulators. Furthermore, APT is playing an increasingly important role in device failure-analysis, and in understanding in-service degradation of microstructure of materials subject to, for example, elevated temperatures, nuclear irradiation or corrosive conditions. All contributions featuring research enabled by APT, and in particular the development of APT for new applications, are welcome.
The 8th Atom Probe Tomography School will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.
All details available at:
Article in materials today announcing ifes fellows promotion 2016
Please note the extension in the abstract submission deadline to the APT&M 2016 meeting. All abstract submissions must be submitted by March 1st.
The abstract submission information can be found at the conference website http://www.aptm2016.org/website/index.php
See you in Korea!
Dear IFES Community,
I am writing to encourage you and your colleagues to consider submitting an abstract to the Atom Probe Tomography Session, A12, at the 2016 Microscopy and Microanalysis Meeting, July 24-28, in Columbus, Ohio. The draft A12 session information is provided below for your review. The formal “Call for Papers” is already out, and abstracts are due by February 8. Additional information about the meeting can be found at http://www.microscopy.org/MandM/2016/ .
The invited speakers for this session will focus on recent efforts in quantitative analysis.
We look forward to seeing you and your colleagues at M&M 2016.
Fred Meisenkothen & Eric Steel
M&M 2016 Session A12 Symposium Co-Organizers
A12: Research and Applications in Atom Probe Tomography
Atom probe tomography (APT) is an emergent characterization technique with tremendous potential. To fully realize this potential, researchers are actively exploring new application areas while simultaneously striving to improve the accuracy and reproducibility of the technique. This symposium is designed to bring together technicians, engineers, and scientists, from across disciplines, who share a common interest in atom probe tomography. The session will encompass research and applications spanning a wide variety of topics that include: materials applications; optimization of acquisition conditions; correlative techniques, 3-D reconstruction, and data analysis; specimen preparation techniques; detector performance; modeling and measurements to understand the impact of specimen and instrument parameters; and accuracy and precision in APT measurements and the development of APT standards.
(Meeting attendees who are interested in this session are also encouraged to attend the Pre-Meeting Congress, Essentials of Atom Probe Tomography, that will be held earlier in the week, on July 24.)
We are pleased to organize the 2015 European APT workshop. The main goal is to bring together young and experienced scientists to share current research findings in the field of atom probe tomography. Lectures will be held by experts on their cutting edge research.
You will have the opportunity to establish contact with scientific groups from all around Europe and hear about their latest relevant work.
You can find detailed information regarding important deadlines, registration and accommodation on our website. Updates will be available regularly.
We welcome your participation and active discussions on a broad range of topics.
Looking forward to seeing you in Leoben, Austria from October 6-9.
On behalf of the organizing committee,
The 7th Atom Probe Tomography School will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.
All details available at:
The IFES steering committee is pleased to announce the new award of Fellow of the International Field Emission Society. Fellow awards will be conferred on those people recognised as eminent scientists in the field of field emission, field ionization, and related phenomena. The round of nominations for the class of Inaugural Fellows is open now through 1 August 2015. Note that nominations for Fellowship can only be made by current members of the Field Emission Society.
Please see “http://fieldemission.org/Fellowship_Nomination” for further details of the award and nomination procedure.
A mandatory ifes account is required to access to the section "http://fieldemission.org/?q=user/login".
We invite you to submit an abstract to the AVS 62nd International Symposium and Exhibition that will take place the week of October 18-23, 2015 in San Jose, California.
The M&M 2015 abstract deadline is February 9th. The APT Symposium Advancing Data Collection and Analysis for Atom Probe Tomography has been organized to highlight the most current work in the field. We encourage you to submit your abstract early and we look forward to seeing you in Portland!
You can submit your abstract by following the link:
A13 Advancing Data Collection and Analysis for Atom Probe Tomography
Organizers: Brian Gorman, R. Prakash Kolli, Richard Martens
Atom probe tomography is a rapidly advancing area of materials characterization. Hardware advancements in the recent past have allowed data acquisition from semiconductor, organic, and insulating materials, but also have illustrated difficulties in data interpretation and reconstruction. This symposium will highlight recent research focused on APT analysis of energy materials, steel nanostructures, organic materials, and oxidation and corrosion reactions. Advances in mathematical methods for data analysis as applied to these materials are able to advance the atomic scale understanding of materials science processes. Improved reconstruction research performed using correlative analyses combining APT and computational methods such as first principles, Monte Carlo simulations, and finite element methods will also be highlighted.
Please find attached a flyer to remind you of the Atom Probe Tomography Standards Workshop that will be held on Wednesday, November 12th, 2014 at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD.
Please e-mail Eric Steel at email@example.com to pre-register for the Workshop. He requires your full name and country of citizenship so that you can gain entry to NIST at the gate.
Please also find attached the preliminary agenda. A link to NIST?s visitor information is here, http://www.nist.gov/public_affairs/visitor/
Additionally, please consider joining the Atom Probe FIG when you renew your MSA membership. The annual cost to join the FIG is $10.
Arun, Prakash, Eric, and Rich
Please find attached a flyer to remind you of the Atom Probe Tomography Standards Workshop that will be held on Wednesday, November 12th, 2014 at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. Please e-mail Eric Steel at firstname.lastname@example.org to pre-register for the Workshop. He requires your full name and country of citizenship. Greg Thompson IFES
Hello CAMECA® APT User's Group,
We take great pleasure in inviting all atom probe tomography enthusiasts to our 2013 APT User's Group Meeting. The event will take place in downtown Madison on beautiful Lake Mendota next to the iconic UW-Madison Memorial Student Union(June in Madison is a wonderful thing – you won’t want to miss it!).
This meeting is intended to provide a forum for discussing and proposing action on a wide range of atom probe tomography topics. Please pass this message on to your group members and any collaborators.
The meeting will be workshop oriented with session leaders selected by expertise and abstract quality. Participants will work together to propose solutions, make observations, and ask in depth questions.
Attendees are encouraged to submit 1-2 page abstracts in order to be considered as a session leader. Short 'topic' abstracts will also be accepted to suggest subjects for discussions. ‘Topic abstracts’ will be accepted on a wide variety of topics from simple questions to novel solutions to problems and even experiment proposals, etc. There is no limit to the number of abstracts you submit. Session leaders will be awarded a stipend to help defray travel costs.
Session Topics (Two CAMECA sponsored session leaders have been pre-selected, each session will require a third):
1. Novel Applications and Sample Preparation - successes, limits, desires [Dieter Isheim and Stephan Gerstl]
2. Correlative Methods [Daniel Schreiber and Karen Henry]
3. Software - reconstruction, simulation, and new data analysis methods [Michael Moody and Krishna Rajan]
4. To Be Determined - base on submitted abstracts 4. To Be Determined - based on abstract submissions
Please monitor www.atomprobe.com for details. For urgent requests or questions, do not hesitate to email email@example.com. We look forward to welcoming you in Madison!
Details: also see atomprobe.com
Location: UW Pyle Center
Tuesday, June 25
Potential IVAS workshop Q&A - 3PM (TBD)
Arrival reception – 7:00 PM
June 26 & 27
Full day of sessions
Group activity in the evening
Optional AM session – action items, follow up, discussion
Rooms have been reserved at the following locations:
There is a limited block of rooms at these hotels. Both hotels are less than 200 meters from the conference center – breakfast/WIFI included. Register early to ensure you can stay close to the conference center – if you will have a car, be sure to arrange parking with the hotel in advance.
The Lowell Center, 610 Langdon Street
Tel: (608) 256-2621 **Note – Group code/rate is not set up yet, please see atomprobe.com for when this will become available
Group Rate: ~$90-100/night
**Note – Group code/rate at the Lowell Center is not set up yet, please see atomprobe.com for when this will become available
The Campus Inn, 601 Langdon Street
Tel: (608) 257-4391, (800)589-6285
Group Rate: $149/night (Taxi fare from the airport included)
Free registration includes the conference space, all food and beverages, and events.
Travel and lodging is the responsibility of the participant.
Abstract and registration deadlines will be posted soon. Please see www.atomprobe.com
A Postdoctoral Research Assistant in Atom Probe Microscopy position is opened at the University of Oxford.
A three-year postdoctoral position is opened to establish the atom probe facility at Deakin University, close to Melbourne in Australia. For more details see the link here.
A postdoc position is opened at the University of Alabama to work with Prof. Greg Thompson.
More details can be found here.
There will be an atom probe session at the next Microscopy and Microanalysis conference held in Indianapolis, IN, during the first week of August 2013.
Feel free to distribute the flyer (click on the image to download the pdf).
A postdoctoral position is opened at IMEC at Leuven in Belgium to work on nano-electronics devices, more details here.
For a while now, the Centre for Direct Scientific Communication of the CNRS (France) has made available for free the articles from the Journal de Physique that has published several of the IFES proceedings in the 1980's.
These can be found on the server called HAL, via a search on the database (accessible here). Don't worry there is an English version!
A Master position is opened at MPIE in Dusseldorf to perform atom probe investigation of solar cells.
More details here.
A workshop on APT will take place at Minatec in Grenoble on October 4-5 2012, as for the annoucement.
As for the past 5 years now, the Groupe de Physique des Materiaux at the University of Rouen organises a school to introduce students and researchers to the fundamentals and practical aspects of atom probe tomography.
To continue the recent tradition, a poll can be answered here to gather your opinions and views on the last IFES and for the next APT & M in 2014!
Thanks for taking the time to answer the 12 questions. The poll will remain open until the end of September.
IFES 2012, the 53rd symposium is now over!
Just a few photos of the happy organisers:
and of the conference dinner in the Davidson Center, which houses a Saturn V rocket at the Nasa U.S. Space & Rocket Center:
Looking forward to the next meeting!
A workshop of interest to atom probers is organised by the Pacific Northwest National Laboratory. The workshop is free but limited to the first 100 registrants. more details can be found on the flyer visible here.
Dear IFES Members,
Please find here the details of the advert for a 12 months position to study of precipitation in Ni based superalloys using Atom probe tomography, based in Marseille, France.
Following last year's contest, the International Field Emission Society has a new logo!
It was designed downunder, at the Australian Centre for Microscopy and Microanalysis, and here it is:
The 53rd International Field Emission Symposium will be at The University of Alabama, Tuscaloosa, Alabama, USA from May 21st to May 25th 2012.
For more details, please refer to the conference website: