“Frontiers of Atom Probe Tomography Physics, Data Processing, Analysis and Reconstruction”.

 
The workshop will take place in Arlington, VA in the Washington, DC area August 1 and 2. (Program here)
 
Workshop Goal: The primary goal of the workshop is to create a set of guidelines and recommendations to collectively move the APT community towards best practices for data processing, analysis and reconstruction based on state-of-the-art understanding of the underlying mechanisms. In support of that (of what?), on the second day, the main program will end around lunch time.

Workshop Format: To promote a vigorous discussion of the need, challenges, and opportunities for fundamental understanding, data processing, analysis and reconstruction within APT, this two-day workshop will feature ~30 minute presentations from invited speakers and leave ample time for focused group discussion around a set of concrete questions. Discussions will center on (a) field desorption mechanisms (i.e. how does an atom get removed from the surface by the field and (why) is that important), (b) data processing, (c) data analysis and (d) reconstruction. In addition to the invited talks and discussions, there will be an open call for a poster session which will be held at the end of the first day.
 
While in person attendance is preferred, we also welcome the remote attendance of any of the participants. 

We’d be happy to talk via phone or zoom to answer any questions.
 

Warmest regards, ?Emmanuelle Marquis (UM), Wolfgang Windl (OSU), and Ali Sayir (AFOSR)?Workshop Organizers

Follow the link

Dear IFES Community and Colleagues,

We would like to draw your attention to the “Multi-Method High-Resolution Microscopy for Materials Science” symposium at this year’s Materials Science and Engineering (MSE) Congress 2024, to be held in Darmstadt, Germany, from September 24-26.

The symposium is part of “Topic C: Characterization”, and covers a wide range of high-resolution techniques, with a particular focus on APT and TEM, and would therefore serve as an ideal platform to unite the APT community in Europe during this conference. For a comprehensive overview of the symposium content, please refer to the description attached to the email.  

We encourage you, your collaborators and students to submit abstracts dealing with high-resolution techniques, especially APT and TEM, to the conference website by January 31st. More information on how to submit an abstract can be found at:
https://mse-congress.de/call-for-abstracts/abstract-submission-management

We look forward to seeing you at the MSE2024 in Darmstadt.

Best regards,
Anna Jelinek and Irmgard Weißensteiner
Montanuniversität Leoben, Austria

Dear all,

We would like to announce a workshop focused on the measurement of H by atom probe tomography that will take place 16–18 April 2024 at the Max-Planck-Institut für Eisenforschung in Düsseldorf, Germany.

We have invite experts from related techniques to help position our community’s efforts and are planning to have contributed talks and extended times for discussions to help establish best practice in our field. 

We will be planning to record sessions too to help with those who cannot travel but are interested in the content, and will be aiming to write up a summary of the discussions. 

A fully hybrid meeting is being considered, please stay tuned!

More details can be found on the website:

Note that the deadline for abstract submissions is on 26th January 2024 (we are not expecting to shift it to a later date, so please don’t leave this to the last second of the last day...).

We are expecting that there will be no registration fee (fingers crossed that we can find sponsors :D) 

We look forward to welcoming you in Düsseldorf.

Paul, Xavier, Baptiste, Aparna.

CAMECA announces the 2024 Atom Probe Tomography User's Meeting, the biennial gathering of atom probe experts and new users. The conference’s goal to share new techniques, technologies, and information to further the use of APT in research and industrial applications.

Monday, June 17 – Thursday, June 20, 2024

Madison Wisconsin, USA

Meeting topics will include:

• Advanced Applications/Preparation - Cryo, etc.
• Reconstruction Advances - including adaptive reconstruction
• Data analysis techniques and advances
• Laser/Matter Interactions, including simultaneous pulsing
• And more to be announced

Bookmark https://www.atomprobe.com/keyaptlinks/apt-user-meeting-2024 for updates.

The IFES is organizing two symposia at the Microscopy & Microanalysis 2024 Conference in Cleveland, Ohio, covering a range of topics of interest to the community.  The meeting provides a good opportunity for members to meet in between the APT&M conference years. Details of the symposia are given below. Please get in contact with the organisers if you have any questions.

More information, including a call for abstracts and details of the meeting, will be available on the MSA website when the M&M 2024 page becomes available:
https://www.microscopy.org/events/index.cfm

A02 - Data Science and Atom Probe Tomography

Topics

1.                Isotopic and chemical quantification
2.                Mass spectrometry in Atom Probe Tomography
3.                Machine Learning and Artificial intelligence algorithm for Atom Probe
4.                Modelling and reconstruction in APT
5.                APT software and management tools
6.                Data archiving and FAIR principles for APT

Abstract

Recent instrumental developments in Atom Probe Tomography (APT) and Field Ion Microscopy (FIM) have considerably increased the data quantity and quality resulting from the analyses. Physical, structural, or chemical information are embedded and often hidden within these troves of data. For some applications of APT, characterizing accurate composition or isotopic quantification is a major objective. This symposium covers a wide range of methods and new data processing techniques enabling better exploration of materials of interest. Some topics to be covered by this symposium will be data analysis methods, mass spectrometry, image analysis, tomographic reconstruction, denoising, interoperability, correlative analysis, and data management.

Organisers

David Saxey, Curtin University, Australia
Markus Kühbach, Humboldt-Universität zu Berlin, Germany
Andrew London, UK Atomic Energy Authority, UK
David Reinhard, Cameca, USA

A03 - Expanding Capabilities of Atom Probe Tomography

Topics

1.        New developments in field evaporation theories and mechanisms
2.        Advances in APT instrumentation, technique development and specimen preparation
3.        New concepts in APT design
4.        Reconstruction improvements and future directions
5.        Advanced Application of APT in materials science

Abstract

The field of APT sees currently extensive research to understand the physical mechanisms involved in the analyzing process. The aim is to better control instrumental artefacts and to push the imaging performances. In addition, new instrumentation developments are contributing to the expanding range of materials that can be analyzed by the technique with better metrological capabilities. These breakthrough developments (EUV laser pulsing, TEM-APT coupling, in situ/in operando APT, specimen preparation etc.) require a precise knowledge of the physical principles involved. This symposium focuses on these key areas of recent theoretical and instrumentation developments, demonstrates how they expand the application range of APT analysis, and highlights the contributions on related topics.

Organisers

Claudia Fleischman, IMEC, Belgium
Ann Chiaramonti, NIST, USA
Arun Devaraj, PNNL, USA
François Vurpillot, Université de Rouen, France
Karen Kruska, PNNL, USA
Devin Giddings

he GPM Labroatory in Rouen organizes the 2023 edition of the APT School, which will take place during the week 13-17 November 2023 in Rouen, France. The scientific program consists in lectures on the basics of Atom Probe, practical sessions, and an invited lecture by F. De Geuser (SIMAP Laboratory, Grenoble).

Further information can be found on the APT School web page:

https://sites.google.com/view/aptschool2023

DOWNLOAD THE FLYER -  LINK: https://drive.google.com/file/d/1lKdZqcrvCDMXo0wr33xk3JgEg5XDS582/view?usp=sharing

Dear Scientists, Scholars and Students,

It is our pleasure to announce that Virtual Atom Probe Tomography and Microscopy 2022 (V-APT&M2022) will be held between 11th-14th Oct 2022, in Nanjing, China. The V-APT&M2022 is the 59th International Field Emission Symposium. It will gather scientists from the field emission, nanoscience, atom probe, laser-matter interaction and materials science communities. The conference will cover various topics, including fundamental physics, simulation, instrumentation and advanced applications:

· Frontier application in functional material

· Frontier application in structural material

· Frontier application in geological and biological material

· Instrument technique development and laser-specimen interaction

· Atom probe specimen preparation

· Reconstruction method, data treatment and simulation theory

· Open software workshop

· Experiences and issues in using AP Suite

The V-APT&M will include Block Lecture given by an international expert, regular sessions for invited talks and oral presentations, poster sessions and also workshops for intensive discussions and exchange of ideas.

At this V-APT&M2022, an "E.W. Müller Outstanding Emerging Scientist Award" is made for the best orally-presented paper in a competition.

You can find updated information about APTM2022 at https://aptm2022.scievent.com/.

We sincerely welcome you to join in V-APT&M2022.

Gang SHA

Chairman of Organizing Committee of V-APTM2022

Professor, Nanjing University of Science and Technology

The MAS Presidential Science Award honors a senior scientist for outstanding technical contributions to the field of microanalysis over a sustained period of time.

You can read more about this award and past winners at https://the-mas.org/awards/presidential-science-award/. There is also an article featuring Dr. Panitz in the July issue of Microscopy & Microanalysis (https://www.cambridge.org/core/journals/microscopy-today/article/microanalysis-society-awards-2022-award-recipients/F14B57EB58D03EE5402B2A7F5197DF5A/share/9eec108d4dfe2c215da8ee3ac63b33433a21fd91). Dr. Panitz was given the award at the recent 2022 Microscopy & Microanalysis Annual Meeting.

Dr. Panitz is an Emeritus Professor of Physics at the University of New Mexico. He began his microanalytical career at the Pennsylvania State University under the supervision of the esteemed Dr. Erwin Wilhelm Müller, the inventor of the field electron emission and field ion emission microscopes. In 1967, Dr. Panitz and Dr. Müller introduced the concept of the atom-probe field ion microscope at the 14th Symposium of the International Field Emission Society. Dr. Panitz joined the technical staff at Sandia National Laboratory in 1970, where he invented the 10 cm atom probe, the first 3D atom probe and the progenitor of atom probe tomography. In 1975, he received a landmark patent for the field desorption spectrometer, now known as the imaging atom probe. In 1982, Dr. Panitz developed a point-projection microscope technique that obtained the first images of unstained biomolecules on a metal substrate. Four years later, he invented and patented the first liquid field emission detector for immunochemical sensing. Using these new technologies at Sandia, he pushed the boundaries of implantation depth profiling and biomolecule imaging. In 1988, he joined the faculty at UNM, where he was a professor in the Physics and Material Science departments and the School of Medicine. While at UNM, he developed a novel curriculum for his undergraduate electricity and magnetism laboratory course that encouraged critical thinking and role playing in a structured environment of cooperative learning groups, which is still in use today. In 1993, Dr. Panitz founded High-Field Consultants to provide atom-probe expertise to industrial and academic clients. He is currently organizing a museum to record and display the history of atom probe technology.

Exploration of experimental methods for quantification and imaging of hydrogen reactions by atom probe tomography

Hydrogen is gathering increasing attention due to its importance as an energy vector. Beyond this aspect, it plays an important role in determining the structural properties of metals, and interacts with functional defects in semiconductors.

The potential of advanced analysis and imaging techniques for an in-depth study of hydrogen - an often elusive element for many microanalysis techniques - is linked to their ability to analyze chemical species present on the surface or in the volume of a sample, allowing their localization and chemical identification. The Tomographic Atom Probe allows the detection of single atoms and their localization in 3D within a nanometric volume. However, many problems exist concerning hydrogen because it is generally found in its gaseous form H2 within the analysis chambers and represents a spurious signal that degrades the chemical sensitivity of the analysis [2,3]. Moreover, hydrogen also participates in surface chemical reactions.
This PhD topic proposes to develop methodological approaches that can target the quantification of hydrogen, its localization, but also the temporal spatial imaging of phenomena involving chemical reactions that would take place at the surface of the analyzed samples.

The candidate will develop techniques for sample preparation and analysis by Atom Probe Tomography, as well as methods for the exploitation of data from these experiments, while studying the theory behind field evaporation and the basics of high field chemistry. He/she should have a good knowledge of solid state physics and/or surface chemistry.
This thesis is financed within the framework of a Labex EMC3 project ("Quantification and advanced physico-chemical imaging: application to hydrogen in materials")
Contact Groupe de Physique des Matériaux / Université de Rouen : Lorenzo.rigutti@univ-rouen.fr

Références Bibliographiques :
[1] Seidman, D., & Stiller, K. (2009). An Atom-Probe Tomography Primer. MRS Bulletin, 34(10), 717-724. doi:10.1557/mrs2009.194 https://web.archive.org/web/20190503002941id_/https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E701B95B9EEA8BC4F0F91477C7C191C9/S088376940000378Xa.pdf/div-class-title-an-atom-probe-tomography-primer-div.pdf
[2] Sundell, G., Thuvander, M., & Andrén, H. O. (2013). Hydrogen analysis in APT: methods to control adsorption and dissociation of H2. Ultramicroscopy, 132, 285-289.
[3] L. Rigutti et al., “Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors,” J. Phys. Chem. C, vol. 125, no. 31, pp. 17078–17087, Aug. 2021, doi: 10.1021/acs.jpcc.1c04778

In order to apply for this PhD program, please follow the link :

https://emploi.cnrs.fr/Gestion/Offre/Default.aspx?Ref=UMR6634-CHRVUR-038

http://fieldemission.org/files/Personal_pictures/Vurpifra/PhD%20Thesis%20at%20GPM%20Rouen%20-%20Hydrogen%20Microscopy.pdf

October 25, 2021

Dear Members of the International Field Emission Society:

On Wednesday, 20 October 2021 we convened the last IFES steering committee meeting with members David Larson (as President), Julie Cairney (as Vice-President), and Mattias Thuvander (Steering Committee Member. The (newly elected) Steering Committee would like to express their appreciation for the excellent leadership and work which Dave, Julie and Mattias did for the ISC during their (extended) tenure.  The have served on the committee now for more than seven years and have made a substantial contribution to our society. We are all grateful for their extended service.

Under the direction of the former team, we can point out the strong health of the field emission society (financially and scientifically), and the recognition of the IFES as a main actor in science societies worldwide. The IFES was associated with several worldwide events, such as M&M or IMC, and organized highly successful in-person symposia in Korea (2016, Pohang) and the USA (2018, Washington DC). We may note also the strong and regular collaboration with Cambridge University Press, the proceedings of the Society being now published in Microscopy & Microanalysis (current impact factor >4) with no publication charges for registered members (proceedings are freely accessible on the IFES webpage).

Because of the SARS-CoV-2 outbreak, it was one of the longest tenures of ISC, and we all recognize the efficiency of the former team to manage this major crisis. We have witnessed worldwide events that are unprecedented in the history of the society. In early 2020, our society was on track to hold the 57th IFES-sponsored symposia in July 2020 in Oxford. The ISC was forced to reschedule the Oxford APT&M conference in November 2020, and this conference was switched to a virtual format. The conference was very successful, with more than 200 delegates registered for the event, which was held live on a video conferencing platform, and with sessions subsequently posted online for later viewing to accommodate for those delegates with challenging time-zone differences. Despite these challenges, there was a strong live audience participation and scientific engagement throughout all of the sessions. Following this success, a second virtual conference was organized in September 2021 in Pacific Northwest National Laboratory (USA) (being the 58th IFES-sponsored symposia). This event was also successful with more than 240 registrations in total and 86 abstract submissions. More than half of abstracts were accommodated in the program as live talks and some recorded talks. Two sessions (morning/afternoon) were split to cater for all three time zones. Amazing poster sessions and break-out discussions were held using the Gathertown platform.

During this conference, a steering committee election was organized and we are happy to welcome newly elected committee members (F. Vurpillot, A.  Chiaramonti, and C. Fleischmann). We are also proud to announce the new composition of the ISC officers consisting of F. Vurpillot (President), A. Devaraj (Vice-President), R. Marceau (Secretary), and P. Bagot (Treasurer).

Following the success, the last two virtual meetings by PNNL and Oxford, we are happy to announce the opening of a bid for the organisation of a Virtual APT&M meeting next year (2022). Note that we are forced to postpone the next in-person conference (hopefully to 2023) measuring the uncertainties in travel restrictions due to the SARS-CoV2.

Respectfully, and on behalf of the (New and Former) Steering Committee,

Francois Vurpillot, Ph.D.
President, International Field Emission Society

David J. Larson, Ph.D.
Past-President, International Field Emission Society

If you wish to propose a bid for the Meeting Organization, please send rapidly an email to our secretary Ross Marceau ( ross.marceau@deakin.edu.au )

Dear fellow APT’ers,

With the new year in full swing, we wanted to bring to your attention opportunities to participate at the M&M 2021 conference in Pittsburgh PA, USA, August 1-5, 2021.  There will be an APT-centric session that focuses on P13 – Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis (P13), co-organized by Danny Perea, Dan Haley and James Douglas.  The call for papers is now open.

Confirmed Invited speakers for P13 (alphabetical):

• Charles Fletcher (Oxford University)
• Jonathan Houard (University of Rouen)
• Tong Li (Ruhr University Bochum)
• Ingrid McCarroll (University of Sydney)
• Fredrick Meisenkothen (National Institute of Standards and Technology)
• Jeramy Zimmerman (Colorado School of Mines)

Full Symposium Descriptions found here

There are also other sessions relevant to the breadth of science represented by our APT community, such as those working the nuclear materials (P05), minerals (A09) and biominerals (A12). The symposia that may be most aligned with our APT community are listed below for convenience:

• P13 - Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
• P05 - Evaluation of Materials for Nuclear Applications
• P12 - Microscopy & Spectroscopy of Energy Conversion and Storage Materials
• A09 - Moon dust, Minerals and Microscopy
• A12 - Microscopy and Microanalysis of Biomineralized and Biomimetic Materials and Structures
• B06 - Multi-Modal Multi-Dimensional Microscopy

Travel:

So far it is planned as an in-person meeting. But regarding travel, we know that at this very time there is great uncertainty for travel, especially internationally, with the COVID-19 virus rampant around the world. However, it is with hope from the M&M program committee, that travel restrictions will be relaxed in time to allow significant attendance to the in-person meeting. Recent news of the vaccine certainly allows for increased optimism.

Also, with 2021 being an off-year with the biennial APT&M meeting sponsored by IFES, we are optimistic the symposia will be well attended by our community. It would be great for us all to meet again in person, and for many for the first time.  

Call for Papers HERE (more session details found in link):

The site is open for the submission of papers (i.e. extended abstracts that are referenceable). Submission deadline Feb 18, 2021 (11:59 PM, U.S. Eastern Time.). Note that M&M has extended this deadline for a number of previous years, but no guarantee it will be extended).

Upload your paper HERE

M&M 2021 Submission Instructions and Tips HERE

Information about Meeting Awards HERE

We hope to see you there!

Cheers!

Danny Perea, Dan Haley, and James Douglas

           WASHINGTON — The National Academy of Engineering (NAE) has elected 106 new members and 23 international members, announced NAE President John L. Anderson on 9 Feb 2021. This brings the total U.S. membership to 2,355 and the number of international members to 298.

          Election to the National Academy of Engineering is among the highest professional distinctions accorded to an engineer. Academy membership honors those who have made outstanding contributions to "engineering research, practice, or education, including, where appropriate, significant contributions to the engineering literature" and to "the pioneering of new and developing fields of technology, making major advancements in traditional fields of engineering, or developing/implementing innovative approaches to engineering education."  Election of new NAE members is the culmination of a yearlong process. The ballot is set in December and the final vote for membership occurs during January.

           Individuals in the newly elected class will be formally inducted during the NAE's annual meeting on Oct. 3, 2021.

Thomas F. Kelly, founder and CEO, Steam Instruments, Madison, Wis, was elected for his contribution to the design and commercialization of the local electrode atom probe to yield 3D atomic-scale analysis of materials.

Dr. Sten Lambeets (winner of the 2018 EW Müller Outstanding Emerging Scientist Award) has received the prestigious Solvay 2018 doctoral thesis award: https://www.emsl.pnnl.gov/emslweb/news/choreographing-rhodium-reactions-leads-award

Dr. Baptiste Gault wins the most important research funding prize in Germany, the Gottfried Wilhelm Leibniz Prize:

https://www.mpie.de/4166019/leibniz-gault

https://www.dfg.de/en/funded_projects/prizewinners/leibniz_prize/2020/gault/index.jsp

Dr. Baptiste Jean Germain Gault

Materials Science, Max-Planck-Institut für Eisenforschung, Düsseldorf

Baptiste Gault is being awarded the Leibniz Prize for the development of new techniques in atom probe tomography. These techniques enable both spatial resolution at the atomic scale and the quantification of elements, thus allowing the atomically resolved 3D representation of materials with a complex microstructure. During his doctorate, Gault successfully incorporated ultra-fast laser sources in an atom probe. As a result, instead of only conductive metals, researchers could now also characterise insulating materials including semiconductors, ceramics and biological material at the atomic level. Through further work on the use of pulsed lasers, Gault developed atom probe tomography into a technique applicable to all materials that can create 3D images of materials with atomic resolution. Gault's internationally recognised contributions to atom probe tomography are important to a wide range of material sciences applications.

Baptiste Gault studied physics in Le Havre, Paris and Rouen. In Rouen, he wrote his dissertation as part of the Groupe de Physique des Matériaux (GPM-CNRS). Following that, he made research visits to Sydney, Oxford and Hamilton, Canada between 2007 and 2015. Since 2016, he has led the Atom Probe Tomography group at Max-Planck-Institut für Eisenforschung in Düsseldorf and in 2018 he was awarded an ERC Consolidator Grant.

APT&M 2020

Keble College, University of Oxford (7th - 10th July 2020)

https://eapt2019.jimdosite.com/

IFES Image Contest

IFES will be holding an image contest in conjunction with APT&M 2018. The contest is open to all APT&M 2018 participants. The submitted image must be free of copyrights and by entering the contest, the participant agrees to let the IFES freely use the image for non-commercial purposes.

- Only one submission per participant is permitted.

- Entries will be evaluated according to overall aesthetics and scientific impact.

- Text/labeling to support the scientific aspect should be brief & embedded below the image (max equivalent of  two sentences).

- Applicants are welcome to submit different visualization formats (e.g. VR, movies, 3D print-outs etc.), but are responsible for the set-up & display of entries that are not in the form of 2D images submitted on the website.  If an alternative format is submitted, a standard 2D image must also be submitted on the website as an official entry and the Steering Committee should be notified separately that there will be an alternative format.

The judging panel will be composed of members of the IFES International Steering Committee. The top two images will be selected and the winning images will be announced at the APT&M 2018 Awards Banquet. 

Image Submission Deadline: June 8, 2018

Image Submission Instructions:

• To upload, create an account on fieldemission.org (http://fieldemission.org/new_account.php) or log-in if you already have an account (http://fieldemission.org/login.php)
• Go to the contest section (http://fieldemission.org/contest.php ), and upload a high resolution (jpg, bmp, etc...) along with a two sentence caption to explain image.

David Seidman, IFES fellow, and former president of the IFES was elected at the National Academy of Engineering,

(Seidman, David N., Walter P. Murphy Professor, department of materials science and engineering, Northwestern University, Evanston, Ill. For contributions to understanding of materials at the atomic scale, leading to advanced materials and processes.)

Election to the National Academy of Engineering is among the highest professional distinctions accorded to an engineer. Academy membership honors those who have made outstanding contributions to "engineering research, practice, or education, including, where appropriate, significant contributions to the engineering literature" and to "the pioneering of new and developing fields of technology, making major advancements in traditional fields of engineering, or developing/implementing innovative approaches to engineering education."

Individuals in the newly elected class will be formally inducted during a ceremony at the NAE's annual meeting in Washington, D.C., on Sept. 30, 2018. A list of the newly elected members and foreign members follows, with their primary affiliations at the time of election and a brief statement of their principal engineering accomplishments.

https://www.eurekalert.org/pub_releases/2018-02/naos-nao020718.php

Atom Probe Tomography and Microscopy (APT&M) 2018

Final Call for Papers

Due to the possibility of a U.S.A. federal government shutdown

Abstract Submission Deadlines

Have been Extended

• Final Abstract Submission Deadline: January 31, 2018

Abstracts should not exceed 1 page in length, including figures (see template). Email abstracts to aptm2018@nist.gov.

• Final Müller Application Deadline: January 31, 2018

Note that same deadline for Muller abstract submission to be sent to https://tinyurl.com/aptm2018 and Package (Abstract/CV/letter/paper) for candidature selection to http://fieldemission.org (Don't forget to log in to apply!!)

Please check our website (https://tinyurl.com/aptm2018) for additional information about the meeting. 

Join our Twitter Chat using #APTM2018

We look forward to seeing you at APT&M 2018!

Hi IFES

See below! The APT&M call for papers is live….links take you to the sites. Please note you must pre-register to attend

See you in Gaithersburg in June 2018!

Greg Thompson

IFES Secretary

June 10 - June 15, 2018

National Institute of Standards and Technology (NIST)

Gaithersburg, MD, U.S.A.

The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy. Topics of interest have included: correlative techniques (e.g. electron tomography, SIMS, …); reconstruction methods; simulations, modeling and computational methods; field ion microscopy (FIM); laser-matter interactions; characterization of nanoscale materials and structures (metals, semiconductors, ceramics, organics, biologicals, and liquids); heat transfer at the nanoscale; optical properties at the nanoscale; instrument and technique development; and more! Ph.D. students, or recent graduates, are encouraged to submit an application package to the E.W. Müller Young Scientist Award Competition. As always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow researchers.

• Abstract Submission Deadline: January 22, 2018

Abstracts should not exceed 1 page in length, including figures (see template). Email abstracts to aptm2018@nist.gov.

Abstract Notification Deadline: February 28, 2018.

• Müller Application Deadline: January 22, 2018

• Registration Opens: January 2018 - Register!

Because NIST is a controlled-access facility, you must pre-register to attend. 

• Travel Info
• Lodging Info

Please check our website (https://tinyurl.com/aptm2018) for additional information about the meeting.  The full meeting registration includes breakfast and lunch, Monday-Thursday.

We look forward to seeing you at APT&M 2018!

June 10 - June 15, 2018

National Institute of Standards and Technology (NIST)

Gaithersburg, MD, U.S.A.

The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy. Topics of interest have included: correlative techniques (e.g. electron tomography, SIMS, …); reconstruction methods; simulations, modeling and computational methods; field ion microscopy (FIM); laser-matter interactions; characterization of nanoscale materials and structures (metals, semiconductors, ceramics, organics, biologicals, and liquids); heat transfer at the nanoscale; optical properties at the nanoscale; instrument and technique development; and more! Ph.D. students, or recent graduates, are encouraged to submit an application package to the E.W. Müller Young Scientist Award Competition. As always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow researchers.

• Abstract Submission Deadline: January 22, 2018

Abstracts should not exceed 1 page in length, including figures (see template). Email abstracts to aptm2018@nist.gov.

Abstract Notification Deadline: February 28, 2018.

• Müller Application Deadline: January 22, 2018

• Registration Opens: January 2018 - Register!

Because NIST is a controlled-access facility, you must pre-register to attend. 

• Travel Info
• Lodging Info

Please check our website (https://tinyurl.com/aptm2018) for additional information about the meeting.  The full meeting registration includes breakfast and lunch, Monday-Thursday.

We look forward to seeing you at APT&M 2018!

The next Rouen Atom Probe School  will take place from 16 to 20 October 2017 in our lab.

This school will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.

APT School Rouen 2017

Registration

Deadline September 15th, 2017
The participation to the school is free of charge
The number of participants is limited to 20 people

Online registration
https://sites.google.com/site/aptschoolgpm/

Sincerely yours,

Williams Lefebvre and François Vurpillot

Please note that the European APT work shop registration is open.

https://www.chalmers.se/en/areas-of-advance/materials/events/Pages/European-Atom-Probe-Workshop.aspx

Save the Dates:

The next Atom Probe Tomography and Microscopy Symposium (APT&M 2018) run by The International Field Emission Society (IFES) will be held from June 10 to June 15, 2018 in the United States at the National Institute of Standards and Technology (NIST), in Gaithersburg, Maryland. A fitting location, since it was at NIST, just over 50 years ago, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope (14th Field Emission Symposium, 1967).

Transportation:
•    Three major airports service the area and there are 24+ hotels within a short driving distance of NIST.
•    Public transportation is also available through the Metro subway, MARC rail service, MTA bus service, and taxis.

Venue:
The symposium venue is in close proximity to the nation’s capital, Washington D.C., and several other cities of interest in Maryland and Virginia, including: Baltimore, Annapolis, and Frederick. Washington D.C. is a major tourist, research, and academic hub and is home to many institutions.

Please come join your colleagues for this exciting IFES symposium in 2018.

Additional details about the meeting will be posted as the meeting draws nearer.

High electric fields in electrochemistry and in atom probe tomography
The workshop aims at a discussion of the requirements, challenges and possibilities for an effective description of moderate to intense electric field and its effect on liquid, matter and isolated atoms and particles. We expect stimulating discussions on recent results and scientific concepts.
We would like to invite you to participate in our three-days workshop, which will be held between March 29 and April 1, 2017 at Ringberg Castle. The purpose of the workshop is to bring together distinguished scientists working in the area of atom probe tomography, field-ion microscopy and electrochemistry, to discuss possibilities, requirements, and challenges for the effective modeling of electric fields across a wide range.
The exchange of ideas between seemingly different fields often drives progress, particularly in areas where scientists face similar methodological problems, and advances in the development of effective modeling techniques will be beneficial to each field. To provide ample time for discussion and exchange the workshop will be restricted to 35 participants. Each invited speaker is asked to give a 60-minute tutorial like presentation (not including the discussion of appr. 20 min).

More details here:

http://www.mpie.de/3548907/elfield

The International Field Emission Society (IFES) is pleased to introduce awards for outstanding papers contributed to the Microscopy & Microanalysis (M&M) meeting, officially sponsored by the Society, competitively judged based upon the quality of the submitted paper.

These awards are provided to students or postdoctoral researchers in the first two years of their career to help defray travel, lodging and other costs of attending the meeting. All awardees must fit the award criteria, as described here, at the time of the M&M meeting.

Ifes Award M&M

The International Field Emission Society will co-sponsor Microscopy & Microanalysis 2017 August 6-10, 2017 in St. Louis, MO.
The symposium organised by IFES at this conference will mark the 50th anniversary since the development of atom probe. There will be three APT-related symposia at this conference and the entire conference is co-sponsored by IFES so we strongly encourage your attendance.

Here the topic of the differents sessions :

A11 Instrumentation of Atom Probe: 50 Years and Counting

Ross Marceau, Prakash Kolli, Thomas Kelly
*Featured Invited Speaker: John Panitz, Emeritus Professor of Physics, University of New Mexico

The year 2017 marks the 50th anniversary of atom probe. The technique has a rich history from its origin with field ion microscopy as a precursor, through the evolution of many advancements, to the recent flourishing of its most prominent form, atom probe tomography (APT). The proliferation of APT has continued with its impact upon an increasingly broad range of materials research. The aim of this symposium is twofold: to capture and showcase some of the key historical breakthroughs that underpin the technique to this day, noting their associated impacts on scientific research; and to highlight ongoing research at the cutting edge of APT instrumentation and technique development. Contributions are welcome from both these areas. Please also see below for suggested topics of interest.

 
A12 Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Baptiste Gault, Arun Deveraj, David J. Larson

This symposium is part of the event organized for the 50th anniversary of the atom probe, and will focus on the methods used to treat raw data, in order to build the point-cloud that constitutes the tomographic reconstruction, as well as the methods applied to the point cloud to extract information regarding the presence of secondary phases, atomic clusters, or local structure (e.g. atomic planes). Another aspect that will be covered are numerical simulations of the field evaporation process which underpins atom probe tomography, and which enable to gain a better understanding of the fundamental aspects of the technique, including the image formation and some of the artifacts commonly affecting the data. Target attendees will include scientists and engineers from all levels with an interest in atom probe tomography.

 
A13 Applications of Atom Probe Tomography

Michael Moody, Mattias Thuvander, Didier Blavette

Atom probe tomography (APT) continues to be adapted for the atomic-scale characterisation of an increasingly diverse range of materials and devices. APT underpins research into a wide variety of alloys and semiconductors, and more recently, the analysis of materials previously considered too exotic for APT, such as minerals, bio-materials and large band gap insulators. Furthermore, APT is playing an increasingly important role in device failure-analysis, and in understanding in-service degradation of microstructure of materials subject to, for example, elevated temperatures, nuclear irradiation or corrosive conditions. All contributions featuring research enabled by APT, and in particular the development of APT for new applications, are welcome.

M&M2017

The 8th Atom Probe Tomography School will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.

All details available at:

Article in materials today announcing ifes fellows promotion 2016

http://www.materialstoday.com/nanomaterials/news/seeing-is-believing/

IFES community

Please note the extension in the abstract submission deadline to the APT&M 2016 meeting. All abstract submissions must be submitted by March 1st.

The abstract submission information can be found at the conference website http://www.aptm2016.org/website/index.php

See you in Korea!

Greg Thompson

IFES Secretary

Dear IFES Community,

I am writing to encourage you and your colleagues to consider submitting an abstract to the Atom Probe Tomography Session, A12, at the 2016 Microscopy and Microanalysis Meeting, July 24-28, in Columbus, Ohio. The draft A12 session information is provided below for your review. The formal “Call for Papers” is already out, and abstracts are due by February 8. Additional information about the meeting can be found at http://www.microscopy.org/MandM/2016/ .

The invited speakers for this session will focus on recent efforts in quantitative analysis.

We look forward to seeing you and your colleagues at M&M 2016.

Fred Meisenkothen & Eric Steel

M&M 2016 Session A12 Symposium Co-Organizers

A12: Research and Applications in Atom Probe Tomography

Atom probe tomography (APT) is an emergent characterization technique with tremendous potential. To fully realize this potential, researchers are actively exploring new application areas while simultaneously striving to improve the accuracy and reproducibility of the technique. This symposium is designed to bring together technicians, engineers, and scientists, from across disciplines, who share a common interest in atom probe tomography. The session will encompass research and applications spanning a wide variety of topics that include: materials applications; optimization of acquisition conditions; correlative techniques, 3-D reconstruction, and data analysis; specimen preparation techniques; detector performance; modeling and measurements to understand the impact of specimen and instrument parameters; and accuracy and precision in APT measurements and the development of APT standards.

(Meeting attendees who are interested in this session are also encouraged to attend the Pre-Meeting Congress, Essentials of Atom Probe Tomography, that will be held earlier in the week, on July 24.)

The 7th Atom Probe Tomography School will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.

All details available at:
http://gpm.labos.univ-rouen.fr/APT2015

The IFES steering committee is pleased to announce the new award of Fellow of the International Field Emission Society.  Fellow awards will be conferred on those people recognised as eminent scientists in the field of field emission, field ionization, and related phenomena.  The round of nominations for the class of Inaugural Fellows is open now through 1 August 2015.  Note that nominations for Fellowship can only be made by current members of the Field Emission Society.

Please see “http://fieldemission.org/Fellowship_Nomination” for further details of the award and nomination procedure.

A mandatory ifes account is required to access to the section "http://fieldemission.org/?q=user/login".

We invite you to submit an abstract to the AVS 62^nd International Symposium and Exhibition that will take place the week of October 18-23, 2015 in San Jose, California.

https://www.avs.org/Symposium

The M&M 2015 abstract deadline is February 9th.  The APT Symposium Advancing Data Collection and Analysis for Atom Probe Tomography has been organized to highlight the most current work in the field.  We encourage you to submit your abstract early and we look forward to seeing you in Portland!

You can submit your abstract by following the link:

http://www.microscopy.org/MandM/2015/registration/submityourpaper.cfm

A13 Advancing Data Collection and Analysis for Atom Probe Tomography
Organizers: Brian Gorman, R. Prakash Kolli, Richard Martens

Atom probe tomography is a rapidly advancing area of materials characterization. Hardware advancements in the recent past have allowed data acquisition from semiconductor, organic, and insulating materials, but also have illustrated difficulties in data interpretation and reconstruction. This symposium will highlight recent research focused on APT analysis of energy materials, steel nanostructures, organic materials, and oxidation and corrosion reactions. Advances in mathematical methods for data analysis as applied to these materials are able to advance the atomic scale understanding of materials science processes. Improved reconstruction research performed using correlative analyses combining APT and computational methods such as first principles, Monte Carlo simulations, and finite element methods will also be highlighted.

Please find attached a flyer to remind you of the Atom Probe Tomography Standards Workshop that will be held on Wednesday, November 12th, 2014 at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD.

Please e-mail Eric Steel at eric.steel@nist.gov to pre-register for the Workshop. He requires your full name and country of citizenship so that you can gain entry to NIST at the gate.

Hello CAMECA^® APT User's Group,

We take great pleasure in inviting all atom probe tomography enthusiasts to our 2013 APT User's Group Meeting. The event will take place in downtown Madison on beautiful Lake Mendota next to the iconic UW-Madison Memorial Student Union(June in Madison is a wonderful thing – you won’t want to miss it!).

This meeting is intended to provide a forum for discussing and proposing action on a wide range of atom probe tomography topics. Please pass this message on to your group members and any collaborators.

The meeting will be workshop oriented with session leaders selected by expertise and abstract quality. Participants will work together to propose solutions, make observations, and ask in depth questions.  

Attendees are encouraged to submit 1-2 page abstracts in order to be considered as a session leader. Short 'topic' abstracts will also be accepted to suggest subjects for discussions. ‘Topic abstracts’ will be accepted on a wide variety of topics from simple questions to novel solutions to problems and even experiment proposals, etc. There is no limit to the number of abstracts you submit. Session leaders will be awarded a stipend to help defray travel costs.

Session Topics (Two CAMECA sponsored session leaders have been pre-selected, each session will require a third):  
1.        Novel Applications and Sample Preparation - successes, limits, desires [Dieter Isheim and Stephan Gerstl]
2.        Correlative Methods [Daniel Schreiber and Karen Henry]  
3.        Software - reconstruction, simulation, and new data analysis methods [Michael Moody and Krishna Rajan]
4.        To Be Determined - base on submitted abstracts 4.  To Be Determined - based on abstract submissions

Please monitor www.atomprobe.com for details.  For urgent requests or questions, do not hesitate to email aptusers@ametek.com. We look forward to welcoming you in Madison!

Details:  also see atomprobe.com
Location:  UW Pyle Center  
Tuesday, June 25
Potential IVAS workshop Q&A - 3PM (TBD)
Arrival reception – 7:00 PM

June 26 & 27
Full day of sessions
Group activity in the evening

June 28
Optional AM session – action items, follow up, discussion
Departure

Rooms have been reserved at the following locations:
There is a limited block of rooms at these hotels. Both hotels are less than 200 meters from the conference center – breakfast/WIFI included.  Register early to ensure you can stay close to the conference center – if you will have a car, be sure to arrange parking with the hotel in advance.  

The Lowell Center, 610 Langdon Street
Tel: (608) 256-2621  **Note – Group code/rate is not set up yet, please see atomprobe.com for when this will become available
Website: www.conferencing.uwex.edu/lodging.cfm
Email: Lowell@ecc.uwex.edu
Group Rate: ~$90-100/night  
**Note – Group code/rate at the Lowell Center is not set up yet, please see atomprobe.com for when this will become available


The Campus Inn, 601 Langdon Street
Tel: (608) 257-4391, (800)589-6285
Website: www.thecampusinn.com
Email: info@thecampusinn.com
Group Rate: $149/night (Taxi fare from the airport included)

Free registration includes the conference space, all food and beverages, and events.
Travel and lodging is the responsibility of the participant.
Abstract and registration deadlines will be posted soon.  Please see www.atomprobe.com
 

A Postdoctoral Research Assistant in Atom Probe Microscopy position is opened at the University of Oxford.

For more details here is a description of the job (link) and a link to the university website (link).

A three-year postdoctoral position is opened to establish the atom probe facility at Deakin University, close to Melbourne in Australia. For more details see the link here.

A postdoc position is opened at the University of Alabama to work with Prof. Greg Thompson.

More details can be found here.

There will be an atom probe session at the next Microscopy and Microanalysis conference held in Indianapolis, IN, during the first week of August 2013.

Feel free to distribute the flyer (click on the image to download the pdf).

A postdoctoral position is opened at IMEC at Leuven in Belgium to work on nano-electronics devices, more details here.

For a while now, the Centre for Direct Scientific Communication of the CNRS (France) has made available for free the articles from the Journal de Physique that has published several of the IFES proceedings in the 1980's. 

These can be found on the server called HAL, via a search on the database (accessible here). Don't worry there is an English version!

A Master position is opened at MPIE in Dusseldorf to perform atom probe investigation of solar cells.

More details here.

A workshop on APT will take place at Minatec  in Grenoble on October 4-5 2012, as for the annoucement.

As for the past 5 years now, the Groupe de Physique des Materiaux at the University of Rouen organises a school to introduce students and researchers to the fundamentals and practical aspects of atom probe tomography.

Find here the poster and the preliminary program of the school that will take place October 15-19 2012.

To continue the recent tradition, a poll can be answered here to gather your opinions and views on the last IFES and for the next APT & M in 2014!

Thanks for taking the time to answer the 12 questions. The poll will remain open until the end of September.

IFES 2012, the 53rd symposium is now over!

Just a few photos of the happy organisers:

and of the conference dinner in the Davidson Center, which houses a Saturn V rocket at the Nasa U.S. Space & Rocket Center:

Looking forward to the next meeting!

A workshop of interest to atom probers is organised by the  Pacific Northwest National Laboratory. The workshop is free but limited to the first 100 registrants. more details can be found on the flyer visible here.

Dear IFES Members,

Please find here the details of the advert for a 12 months position to study of precipitation in Ni based superalloys using Atom probe tomography, based in Marseille, France.

Following last year's contest, the International Field Emission Society has a new logo!

It was designed downunder, at the Australian Centre for Microscopy and Microanalysis, and here it is:

The 53rd International Field Emission Symposium will be at The University of Alabama, Tuscaloosa, Alabama, USA from May 21^st to May 25^th  2012.

For more details, please refer to the conference website:

www.ifes2012.ua.edu